NANOMECHANICS

 

These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes are designed for nanoindenation and induce high levels of plastic deformation which allows hem to be used with Oliver-Pharr analysis to measure both the modulus and hardness of materials. These probes have demonstrated highly repeatable deep (~100nm) indentations in fused silica. The high resolution tip apex enables in-situ imaging of indents using the same probe.

  • Highly doped with boron with a macroscopic resistivity of 0.003 - 0.005 Ω∙cm

  • Typical contact resistance of 10 kΩ depending on contact radius (measured on a silver surface)

  • Gold reflex coating on the detector side of the cantilever to enhance reflectivity

 
 

Tip Specifications

 
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Bulk Tip see < General >

 
 

Cantilever Specifications

 
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Pricing

 

Price per unit probe:

  • NM-RC: €270 or $300

  • NM-TC: €158 or $175

Minimum quantity:

  • 5 probes in one box (5-pack)

  • Must order in multiples of 5 probes

  • Multiply x5 for 5-pack price

 

Volume discounts:

  • 25-pack = 5 %

  • 50-pack = 10 %

  • 100-pack = 15 %

Price List:

Options:

NM-RC-SEM includes

  • High-resolution SEM tip image

  • Tip radius measured at 5, 10 and 100 nm below the tip apex

  • Full cone angle measured between 20 and 100nm

  • Tip Height

  • add €45 or $50 per probe

  • Not Available for NM-TC

 
 
 
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